Results of 65 nm pixel readout chip demonstrator array

被引:7
|
作者
Mekkaoui, A. [1 ]
Garcia-Sciveres, M. [1 ]
Gnani, D. [1 ]
机构
[1] Univ Calif Berkeley, Lawrence Berkeley Natl Lab, Berkeley, CA 94720 USA
来源
JOURNAL OF INSTRUMENTATION | 2013年 / 8卷
关键词
Analogue electronic circuits; Radiation-hard electronics; Front-end electronics for detector readout; VLSI circuits;
D O I
10.1088/1748-0221/8/01/C01055
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Complex and challenging instrumentation projects (LHC upgrades, HL LHC, new Detector concepts) will require the adoption of ever more empowering and complex IC technologies. We clearly see that by moving only two nodes from the current 130 nm CMOS to 65 nm, substantial processing power could be embedded in the front-end system. We have designed and fabricated a prototype pixel readout chip to explore 65 nm CMOS as a potential integrated circuit technology for future particle physics applications. Not only the reported functional test results are very encouraging, but we also found that the process is fundamentally tolerant to radiation doses higher than 600 Mrad.
引用
收藏
页数:7
相关论文
共 50 条
  • [41] First results on 3D pixel sensors interconnected to the RD53A readout chip after irradiation to 1 x 1016 neq cm-2
    Meschini, M.
    Ceccarelli, R.
    Dinardo, M.
    Gennai, S.
    Moroni, L.
    Zuolo, D.
    Demaria, L.
    Monteil, E.
    Gaioni, L.
    Messineo, A.
    Curras, E.
    Duarte, J.
    Fernandez, M.
    Gomez, G.
    Garcia, A.
    Gonzalez, J.
    Silva, E.
    Vila, I.
    Dalla Betta, G. F.
    Mendicino, R.
    Boscardin, M.
    Tracker, C. M. S.
    JOURNAL OF INSTRUMENTATION, 2019, 14
  • [42] 3D TSV hybrid pixel detector modules with ATLAS FE-I4 readout electronic chip
    Fritzsch, T.
    Huegging, F.
    Mackowiak, P.
    Zoschke, K.
    Rothermund, M.
    Owtscharenko, N.
    Pohl, D-L
    Oppermann, H.
    Wermes, N.
    JOURNAL OF INSTRUMENTATION, 2022, 17 (01):
  • [43] Event-driven readout development: testing of the EDWARD65P1 chip with integrated event generators
    Gorni, D. S.
    Deptuch, G. W.
    Maj, P.
    Mandal, S.
    Pinaroli, G.
    JOURNAL OF INSTRUMENTATION, 2025, 20 (03):
  • [44] Characterization of radiation effects in 65nm digital circuits with the DRAD digital radiation test chip
    Casas, L. M. Jara
    Ceresa, D.
    Kulis, S.
    Miryala, S.
    Christiansen, J.
    Francisco, R.
    Gnani, D.
    JOURNAL OF INSTRUMENTATION, 2017, 12
  • [45] The Medipix3RX: a high resolution, zero dead-time pixel detector readout chip allowing spectroscopic imaging
    Ballabriga, R.
    Alozy, J.
    Blaj, G.
    Campbell, M.
    Fiederle, M.
    Frojdh, E.
    Heijne, E. H. M.
    Llopart, X.
    Pichotka, M.
    Procz, S.
    Tlustos, L.
    Wong, W.
    JOURNAL OF INSTRUMENTATION, 2013, 8
  • [46] Characterization of the FE-I4B pixel readout chip production run for the ATLAS Insertable B-layer upgrade
    Backhaus, M.
    JOURNAL OF INSTRUMENTATION, 2013, 8
  • [47] HEPS-BPIX3: a fine pitch pixel readout chip working in single photon counting mode for synchrotron radiation applications
    Cui, S.
    Wei, W.
    Zhang, J.
    Li, H.
    Li, Z.
    Jiang, X.
    Zhu, K.
    Liu, P.
    Wang, Z.
    Chen, Y.
    JOURNAL OF INSTRUMENTATION, 2021, 16 (08)
  • [48] Results on proton-irradiated 3D pixel sensors interconnected to RD53A readout ASIC
    Duarte-Campderros, J.
    Curras, E.
    Fernandez, M.
    Gomez, G.
    Garcia, A.
    Gonzalez, J.
    Silva, E.
    Vila, I
    Jaramillo, R.
    Meschini, M.
    Ceccarelli, R.
    Dinardo, M.
    Gennai, S.
    Moroni, L.
    Zuolo, D.
    Demaria, L.
    Monteil, E.
    Gaioni, L.
    Messineo, A.
    Dalla Betta, G. F.
    Mendicino, R.
    Boscardin, M.
    Hidalgo, S.
    Merlos, A.
    Pellegrini, G.
    Quirion, D.
    Manna, M.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2019, 944
  • [49] Study of Total Ionizing Dose Effects in 65nm Digital Circuits with the DRAD Digital RADiation Test Chip
    Casas, L. M. Jara
    Ceresa, D.
    Kulis, S.
    Miryala, S.
    Christiansen, J.
    Francisco, R.
    Gnani, D.
    2017 17TH EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS (RADECS), 2017, : 443 - 448
  • [50] The SparkPix-S ASIC for the sparsified readout of 1 MHz frame-rate X-ray cameras at LCLS-II: pixel design and simulation results
    Rota, L.
    Mele, F.
    Habib, A.
    Kim, H.
    King, P.
    Markovic, B.
    Perez, A. Pella
    Dragone, A.
    JOURNAL OF INSTRUMENTATION, 2024, 19 (01)