Hardware-circuit-based diagnosis method for open-switch faults in inverters

被引:14
|
作者
An, Q. T. [1 ]
Sun, L. [1 ]
Sun, L. Z. [1 ]
机构
[1] Harbin Inst Technol, Dept Elect Engn, Harbin 150001, Heilongjiang, Peoples R China
基金
中国国家自然科学基金; 中国博士后科学基金;
关键词
DRIVE;
D O I
10.1049/el.2013.0641
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The theory, design, implementation and experimental validation of a hardware-circuit-based diagnosis method for open-switch faults in voltage source inverters are discussed. Operating states of the inverter under both healthy and faulty conditions are analysed. The estimated voltages can be achieved as pre-fault voltages by means of the switching function model of the inverter under a normal condition. Then, the error voltages between the estimated ones and measured ones can be used to detect faults. To achieve reliable diagnosis, the design employs both the amplitude limit and the duration limit to filter the error voltages so as to eliminate effects of the deadtimes and the switching processes of power devices. The proposed method is validated by experiments.
引用
收藏
页码:1089 / 1090
页数:2
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