Schottky diodes with a δ-doped near-surface layer

被引:8
作者
Osvald, J [1 ]
机构
[1] Slovak Acad Sci, Inst Elect Engn, SK-84239 Bratislava, Slovakia
关键词
D O I
10.1063/1.1415533
中图分类号
O59 [应用物理学];
学科分类号
摘要
The influence of planar delta -doping on effective parameters of Schottky diodes has been studied by simulations of I-V curves within a drift-diffusion approximation. It is shown that an inserted delta layer with the same type of conductivity as that of the base semiconductor material has no significant influence on the effective Schottky diode parameters. The change of the potential barrier shape with the insertion of the delta -doped layer with the same type of conductivity as the base semiconductor material influences the diode current only slightly. On the other hand, significant changes were found for the Schottky diodes with the opposite type of delta -doped layer conductivity compared to the base semiconductor. The resultant barriers and the ideality factors both increase with increasing distance of the delta -doped layer from the metal-semiconductor interface. (C) 2001 American Institute of Physics.
引用
收藏
页码:6205 / 6209
页数:5
相关论文
共 15 条
[1]   MOLECULAR-BEAM EPITAXIAL-GROWTH OF NIAL ON GAAS(001) [J].
CHAMBERS, SA .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1989, 7 (04) :737-741
[2]   HIGH SCHOTTKY-BARRIER HEIGHT OF THE AL-N-GAAS DIODES ACHIEVED BY SPUTTER-DEPOSITION [J].
CHEN, CP ;
CHANG, YA ;
HUANG, JW ;
KUECH, TF .
APPLIED PHYSICS LETTERS, 1994, 64 (11) :1413-1415
[3]   SCHOTTKY ENHANCEMENT OF REACTED NIAL N-GAAS CONTACTS [J].
CHEN, CP ;
CHANG, YA ;
KUECH, TF .
APPLIED PHYSICS LETTERS, 1994, 64 (25) :3485-3487
[4]   CURRENT TRANSPORT IN METAL-SEMICONDUCTOR BARRIERS [J].
CROWELL, CR ;
SZE, SM .
SOLID-STATE ELECTRONICS, 1966, 9 (11-1) :1035-&
[5]   THE EFFECT OF THE PLANAR DOPING ON THE ELECTRICAL TRANSPORT-PROPERTIES AT THE ALN-GAAS(100) INTERFACE - ULTRAHIGH EFFECTIVE DOPING [J].
GERALDO, JM ;
RODRIGUES, WN ;
MEDEIROSRIBEIRO, G ;
DEOLIVEIRA, AG .
JOURNAL OF APPLIED PHYSICS, 1993, 73 (02) :820-823
[6]   ENHANCEMENT OF EFFECTIVE BARRIER HEIGHT IN TI-SILICON SCHOTTKY DIODE USING LOW-ENERGY ION-IMPLANTATION [J].
LI, SS ;
KIM, JS ;
WANG, KL .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1980, 27 (07) :1310-1312
[7]   PLANAR-DOPED BARRIERS IN GAAS BY MOLECULAR-BEAM EPITAXY [J].
MALIK, RJ ;
AUCOIN, TR ;
ROSS, RL ;
BOARD, K ;
WOOD, CEC ;
EASTMAN, LF .
ELECTRONICS LETTERS, 1980, 16 (22) :836-837
[8]   SPECIFIC RESISTIVITY OF DELTA-DOPED CONTACTS IN N-GAAS [J].
MARCY, DL ;
MABY, EW ;
NEWMAN, PG ;
KHANNA, R .
JOURNAL OF APPLIED PHYSICS, 1991, 70 (01) :514-516
[9]  
Osvald J, 1998, SOLID STATE ELECTRON, V42, P191, DOI 10.1016/S0038-1101(97)00229-3
[10]   Generalized approach to the parameter extraction from I-V characteristics of Schottky diodes [J].
Osvald, J ;
Dobrocka, E .
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1996, 11 (08) :1198-1202