Laser-induced Forward Transfer for Flip-chip Packaging of Single Dies

被引:6
作者
Kaur, Kamal S. [1 ]
Van Steenberge, Geert [1 ]
机构
[1] Univ Ghent, IMEC, Ctr Microsyst Technol CMST, B-9000 Ghent, Belgium
来源
JOVE-JOURNAL OF VISUALIZED EXPERIMENTS | 2015年 / 97期
关键词
Physics; Issue; 97; LIFT; direct-write; flip-chip; interconnects; indium; micro-bumps; thermo-compression; VCSEL; EXCIMER-LASER;
D O I
10.3791/52623
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Flip-chip (FC) packaging is a key technology for realizing high performance, ultra-miniaturized and high-density circuits in the micro-electronics industry. In this technique the chip and/or the substrate is bumped and the two are bonded via these conductive bumps. Many bumping techniques have been developed and intensively investigated since the introduction of the FC technology in 1960(1) such as stencil printing, stud bumping, evaporation and electroless/electroplating(2). Despite the progress that these methods have made they all suffer from one or more than one drawbacks that need to be addressed such as cost, complex processing steps, high processing temperatures, manufacturing time and most importantly the lack of flexibility. In this paper, we demonstrate a simple and cost-effective laser-based bump forming technique known as Laserinduced Forward Transfer (LIFT)(3). Using the LIFT technique a wide range of bump materials can be printed in a single-step with great flexibility, high speed and accuracy at RT. In addition, LIFT enables the bumping and bonding down to chip-scale, which is critical for fabricating ultra-miniature circuitry.
引用
收藏
页数:10
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