Study on reliability of PQFP assembly with lead free solder joints under random vibration test

被引:27
作者
Che, F. X. [1 ]
Pang, John H. L. [1 ]
机构
[1] Nanyang Technol Univ, Sch Mech & Aerosp Engn, Singapore 639798, Singapore
关键词
Random vibration test; Finite element analysis; Fatigue life; Lead-free solder; Leaded package; BEHAVIOR; PACKAGE;
D O I
10.1016/j.microrel.2015.09.010
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Harsh solder joint reliability testing is needed for high frequency vibration requirements particularly for automotive electronics. In this study, the solder joint reliability for the plastic quad flat package (PQFP) which was mounted on the printed circuit board (PCB) using 95.5Sn-3.8Ag-0.7Cu lead-free solder was investigated using the random vibration test. A high-speed camera was used to capture dynamic response of the PCB and PQFP lead during the random vibration test. The displacement measurement result was used in finite element analysis (FEA) as an input displacement loading to evaluate the stress-strain behavior of the PQFP lead and solder joint. Fatigue life prediction for the copper (Cu) lead and PQFP solder joint was carried out using three different cycle-counting methods and the Miner's law. It was shown that solder fatigue failure is more critical than Cu lead failure for the PQFP assembly under the random vibration test. (C) 2015 Elsevier Ltd. All rights reserved.
引用
收藏
页码:2769 / 2776
页数:8
相关论文
共 22 条
[1]   Characterization of chip scale packaging materials [J].
Amagai, M .
MICROELECTRONICS RELIABILITY, 1999, 39 (09) :1365-1377
[2]  
[Anonymous], 1992, VIBR EXC IPC SM 785
[3]   Vibration reliability test and finite element analysis for flip chip solder joints [J].
Che, F. X. ;
Pang, John H. L. .
MICROELECTRONICS RELIABILITY, 2009, 49 (07) :754-760
[4]  
Che FX, 2004, ELEC COMP C, P421
[5]   Combining vibration test with finite element analysis for the fatigue life estimation of PBGA components [J].
Chen, Y. S. ;
Wang, C. S. ;
Yang, Y. J. .
MICROELECTRONICS RELIABILITY, 2008, 48 (04) :638-644
[6]   Vibration fatigue reliability of BGA-IC package with Pb-free solder and Pb-Sn solder [J].
Kim, Y ;
Noguchi, H ;
Amagai, M .
MICROELECTRONICS RELIABILITY, 2006, 46 (2-4) :459-466
[7]  
Kondo Y., 2003, FATIGUE VARIABLE AMP, V4, P253
[8]   Random vibration reliability of BGA lead-free solder joint [J].
Liu, Fang ;
Meng, Guang .
MICROELECTRONICS RELIABILITY, 2014, 54 (01) :226-232
[9]   Characterizing the Mechanical Properties of Actual SAC105, SAC305, and SAC405 Solder Joints by Digital Image Correlation [J].
Nguyen, T. T. ;
Yu, D. ;
Park, S. B. .
JOURNAL OF ELECTRONIC MATERIALS, 2011, 40 (06) :1409-1415
[10]   Characterization of elasto-plastic behavior of actual SAC solder joints for drop test modeling [J].
Nguyen, Tung T. ;
Park, Seungbae .
MICROELECTRONICS RELIABILITY, 2011, 51 (08) :1385-1392