A lifetime correction method for the gamma-ray yield measurement in (n,x gamma) experiments

被引:0
|
作者
Zhou, HY [1 ]
Huang, GS [1 ]
Fan, GY [1 ]
机构
[1] OHIO UNIV,DEPT PHYS & ASTRON,ATHENS,OH 45701
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D O I
暂无
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A lifetime correction method for the gamma-ray yield measurement in (n,xy) experiments performed by means of TOF technique is proposed. This method makes it possible to determine prompt and delayed gamma-ray data simultaneously in an experiment. It can separate the delayed component from a mixed gamma-ray peak exactly, so that completely pure prompt gamma-ray data can be obtained. It provides an in-beam measurement method for neutron activation cross sections. Especially, it has obvious advantages for yield measurements of decay gamma-rays with lifetimes ranging from 1 ns to several hours. Application techniques under various conditions are discussed. As examples, some results for F, Al and Si samples under 14.9 MeV neutron bombardment are given.
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页码:504 / 509
页数:6
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