A lifetime correction method for the gamma-ray yield measurement in (n,x gamma) experiments

被引：0

作者：

Zhou, HY ^{[1
]}

Huang, GS ^{[1
]}

Fan, GY ^{[1
]}

机构：

[1] OHIO UNIV,DEPT PHYS & ASTRON,ATHENS,OH 45701

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1996年 / 371卷 / 03期

关键词：

D O I：

暂无

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A lifetime correction method for the gamma-ray yield measurement in (n,xy) experiments performed by means of TOF technique is proposed. This method makes it possible to determine prompt and delayed gamma-ray data simultaneously in an experiment. It can separate the delayed component from a mixed gamma-ray peak exactly, so that completely pure prompt gamma-ray data can be obtained. It provides an in-beam measurement method for neutron activation cross sections. Especially, it has obvious advantages for yield measurements of decay gamma-rays with lifetimes ranging from 1 ns to several hours. Application techniques under various conditions are discussed. As examples, some results for F, Al and Si samples under 14.9 MeV neutron bombardment are given.

引用

页码：504 / 509

页数：6

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