Physics-based Switching Model for Cu/SiO2/W Quantum Memristor

被引:0
|
作者
Nandakumar, S. R. [1 ]
Rajendran, Bipin [1 ]
机构
[1] New Jersey Inst Technol, Dept Elect & Comp Engn, Newark, NJ 07102 USA
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页数:2
相关论文
共 50 条
  • [21] A PHYSICS-BASED MODEL FOR VIV ANALYSIS
    Konstantinidis, Efstathios
    PROCEEDINGS OF THE ASME 36TH INTERNATIONAL CONFERENCE ON OCEAN, OFFSHORE AND ARCTIC ENGINEERING, 2017, VOL 2, 2017,
  • [22] A physics-based model of the Kohonen ring
    Radea, P
    Guerrero, J
    Molina, C
    Serneels, R
    MEDICAL IMAGING 1998: IMAGE PROCESSING, PTS 1 AND 2, 1998, 3338 : 1345 - 1356
  • [23] Understanding the thermal conductivity of pristine W and W-Re alloys from a physics-based model
    Wang, Yuanyuan
    Zhao, Jijun
    JOURNAL OF NUCLEAR MATERIALS, 2020, 529
  • [24] NATURE OF CONDUCTION AND SWITCHING IN SIO2
    SHATZKES, M
    AVRON, M
    ANDERSON, RM
    JOURNAL OF APPLIED PHYSICS, 1974, 45 (05) : 2065 - 2077
  • [25] CMOS Compatible Nonvolatile Memory Devices Based on SiO2/Cu/SiO2 Multilayer Films
    Wang Yan
    Liu Qi
    Lv Hang-Bing
    Long Shi-Bing
    Zhang Sen
    Li Ying-Tao
    Lian Wen-Tai
    Yang Jian-Hong
    Liu Ming
    CHINESE PHYSICS LETTERS, 2011, 28 (07)
  • [26] Design of high-performance memristor cell using W-implanted SiO2 films
    Li, Wenqing
    Liu, Xinqiang
    Wang, Yongqiang
    Dai, Zhigao
    Wu, Wei
    Cheng, Li
    Zhang, Yupeng
    Liu, Qi
    Xiao, Xiangheng
    Jiang, Changzhong
    APPLIED PHYSICS LETTERS, 2016, 108 (15)
  • [27] Toward Simplified Physics-Based Memristor Modeling of Valence Change Mechanism Devices
    Ntinas, Vasileios
    Ascoli, Alon
    Messaris, Ioannis
    Wang, Yongmin
    Rana, Vikas
    Menzel, Stephan
    Tetzlaff, Ronald
    IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, 2022, 69 (05) : 2473 - 2477
  • [28] ADSORPTION AND CATALYTIC PROPERTIES OF PD/SIO2, CU/SIO2, AND PD-CU/SIO2 SYSTEMS .1. HYDROGEN, CARBON-MONOXIDE AND OXYGEN-ADSORPTION ON PD/SIO2 AND CU/SIO2
    LEON Y LEON, CA
    VANNICE, MA
    APPLIED CATALYSIS, 1991, 69 (02): : 269 - 290
  • [29] Environmental effects on Cu/SiO2 and Cu/Ti/SiO2 thin film adhesion
    Tymiak, NI
    Li, M
    Volinsky, AA
    Katz, Y
    Gerberich, WW
    MATERIALS RELIABILITY IN MICROELECTRONICS IX, 1999, 563 : 269 - 274
  • [30] A Modified SiO2-Based Memristor with Reliable Switching and Multifunctional Synaptic Behaviors
    Ilyas, Nasir
    Li, Chunmei
    Wang, Jinyong
    Jiang, Xiangdong
    Fu, Hao
    Liu, Fucai
    Gu, Deen
    Jiang, Yadong
    Li, Wei
    JOURNAL OF PHYSICAL CHEMISTRY LETTERS, 2022, 13 (03): : 884 - 893