Simple and cost-effective thickness measurement terahertz system based on a compact 1.55 μm λ/4 phase-shifted dual-mode laser

被引：42

作者：

Ryu, Han-Cheol ^{[1
]}

Kim, Namje ^{[1
]}

Han, Sang-Pil ^{[1
]}

Ko, Hyunsung ^{[1
]}

Park, Jeong-Woo ^{[1
]}

Moon, Kiwon ^{[1
]}

Park, Kyung Hyun ^{[1
]}

机构：

[1] ETRI, THz Photon Creat Res Ctr, Taejon 305700, South Korea

来源：

OPTICS EXPRESS | 2012年 / 20卷 / 23期

基金：

新加坡国家研究基金会;

关键词：

SPECTROSCOPY; GENERATION;

D O I：

10.1364/OE.20.025990

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A simple thickness measurement method based on the coherent homodyne CW THz system was demonstrated; it does not require precise control of the frequencies of the beat source, and only accurate scanning of the optical delay line is needed. Three beat frequencies are sufficient for measuring the thickness of a sample without considering the modulo 2 pi ambiguity. A novel compact 1.55 mu m lambda/4 phase-shifted dual-mode laser (DML) was developed as an optical beat source for the CW THz system. The thickness of a sample was accurately estimated from the measurements using the proposed method. Our results clearly show the possibility of a compact, simple, and cost-effective CW THz system for practical applications. (C) 2012 Optical Society of America

引用

页码：25990 / 25999

页数：10

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