Multi-degree-of-freedom motion error measurement in an ultraprecision machine using laser encoder - Review

被引:51
作者
Lee, ChaBum [1 ]
Lee, Sun-Kyu [1 ,2 ]
机构
[1] Gwangju Inst Sci & Technol, Sch Mechatron, Kwangju 500712, South Korea
[2] Gwangju Inst Sci & Technol, Res Inst Solar & Sustainable Energies, Kwangju 500712, South Korea
基金
新加坡国家研究基金会;
关键词
Measurement; Motion error; Linear stage; Multi-degree-of-freedom; Laser encoder; Angle sensor; COUPLED-WAVE ANALYSIS; 6-DEGREE-OF-FREEDOM MEASUREMENT SYSTEM; SCANNING TUNNELING MICROSCOPE; OPTICAL ENCODER; SURFACE ENCODER; RESOLUTION; ACCURACY; COMPACT; DESIGN; IMPLEMENTATION;
D O I
10.1007/s12206-012-1217-6
中图分类号
TH [机械、仪表工业];
学科分类号
0802 ;
摘要
Recently, in accordance with the increasing market demand for ultraprecision technology, a high precision multi-degree-of-freedom displacement measurement technology has become important for industrial applications such as the field of manufacturing and inspection because those physical quantities, linear and angular displacements, are key parameters for keeping and improving quality control of a production system. A number of instruments capable of precise multi-degree-of-freedom measurements have been built and some novel techniques have been introduced. The current state-of-art techniques for multi-degree-of-freedom motion error measurement in a linear stage using laser encoder-implemented system are reviewed. First, we summarize the basic principles behind the measurement technology of the motion error in a stage and simple encoder system. Next, the basic design principles of practical laser encoder system are discussed using the experience of past and existing cases to refer to the important points and the major scientific results. The current trends in the field are significantly discussed, including the novel techniques under construction and advanced technologies. Lastly, the future of multi-functional laser encoder-implemented system, highlighting the kinds of new science upcoming in the next few years, is discussed.
引用
收藏
页码:141 / 152
页数:12
相关论文
共 90 条
[1]   Real-time atomic encoder using scanning tunnelling microscope and regular crystalline surface [J].
Aketagawa, M ;
Takada, K ;
Rerkkumsup, P ;
Togawa, Y ;
Honda, H .
MEASUREMENT SCIENCE AND TECHNOLOGY, 2006, 17 (03) :513-518
[2]   Optical encoder calibration using lattice spacing and optical fringe derived from a scanning tunnelling microscope and optical interferometer [J].
Aketagawa, Masato ;
Ikeda, Yosuke ;
Tanyarat, Nuttapong ;
Ishige, Masashi .
MEASUREMENT SCIENCE AND TECHNOLOGY, 2007, 18 (02) :503-509
[3]   Two-dimensional encoder with picometre resolution using lattice spacing on regular crystalline surface as standard [J].
Aketagawa, Masato ;
Honda, Hiroshi ;
Ishige, Masashi ;
Patamaporn, Chaikool .
MEASUREMENT SCIENCE AND TECHNOLOGY, 2007, 18 (02) :342-349
[4]  
[Anonymous], 2007, N AM MARK LIN DISPL
[5]  
Barbaric Z. P., 2008, P 16 TEL FOR, P452
[6]  
Beggs JS., 1983, KINEMATICS
[7]   OPTICAL FRINGE SUBDIVISION WITH NANOMETRIC ACCURACY [J].
BIRCH, KP .
PRECISION ENGINEERING-JOURNAL OF THE AMERICAN SOCIETY FOR PRECISION ENGINEERING, 1990, 12 (04) :195-198
[8]  
Bottema O., 1990, Theoretical Kinematics, V24
[9]   A two-dimensional atom encoder using one lateral-dithered scanning tunneling microscope (STM) tip and a regular crystalline lattice [J].
Chaikool, Patamaporn ;
Aketagawa, Masato ;
Okuyama, Eiki .
MEASUREMENT SCIENCE AND TECHNOLOGY, 2009, 20 (08)
[10]  
Cho H., 2006, OPTOMECHATRONICS FUS