Modeling Item-Position Effects Within an IRT Framework

被引:78
作者
Debeer, Dries [1 ]
Janssen, Rianne [1 ]
机构
[1] Katholieke Univ Leuven, Fac Psychol & Educ Sci, B-3000 Louvain, Belgium
关键词
LOGISTIC TEST MODEL; PARAMETER-ESTIMATION; MISSING-DATA; CONTEXT; DIFFICULTY;
D O I
10.1111/jedm.12009
中图分类号
G44 [教育心理学];
学科分类号
0402 ; 040202 ;
摘要
Changing the order of items between alternate test forms to prevent copying and to enhance test security is a common practice in achievement testing. However, these changes in item order may affect item and test characteristics. Several procedures have been proposed for studying these item-order effects. The present study explores the use of descriptive and explanatory models from item response theory for detecting and modeling these effects in a one-step procedure. The framework also allows for consideration of the impact of individual differences in position effect on item difficulty. A simulation was conducted to investigate the impact of a position effect on parameter recovery in a Rasch model. As an illustration, the framework was applied to a listening comprehension test for French as a foreign language and to data from the PISA 2006 assessment.
引用
收藏
页码:164 / 185
页数:22
相关论文
共 50 条
  • [1] Akaike H., 1977, APPL STAT S P DAYT O, P27
  • [2] [Anonymous], 2011, R: A Language and Environment for Statistical Computing
  • [3] [Anonymous], 2008, SAS/STAT 9.2 user's guide
  • [4] [Anonymous], 2006, Assessing Scientific, Reading and Mathematical Literacy: A Framework for PISA 2006, DOI [DOI 10.1787/9789264026407-EN, 10.1787/9789264026407-en]
  • [5] [Anonymous], 2009, Technical Report
  • [6] Bates D., 2011, R PACKAGE VERSION 09
  • [7] Birnbaum A., 1968, Statistical theories of mental test scores, P397
  • [8] Effects of ignoring item interaction on item parameter estimation and detection of interacting items
    Chen, Cheng-Te
    Wang, Wen-Chung
    [J]. APPLIED PSYCHOLOGICAL MEASUREMENT, 2007, 31 (05) : 388 - 411
  • [9] De Boeck P, 2011, J STAT SOFTW, V39, P1
  • [10] Dorans N.J., 1990, APPL MEAS EDUC, V3, P245