Performance projection and thermal management of high performance VLSI designs

被引:0
作者
Wang, LK [1 ]
Chen, HH [1 ]
Yan, TD [1 ]
Hong, BZ [1 ]
机构
[1] IBM Corp, Div Res, TJ Watson Res Ctr, Yorktown Hts, NY 10598 USA
来源
SOLID-STATE AND INTEGRATED-CIRCUIT TECHNOLOGY, VOLS 1 AND 2, PROCEEDINGS | 2001年
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The impacts of chip self-heating induced temperature non-uniformity within the VLSI chip and its influence on the performance on the designs are described in this paper. To accurately model the chip performance, both the electrical and the thermal analysis including chip packaging should be examined together. This paper describes a methodology that allows more accurate temperature calculation of the chip based on the circuit power analysis together with the thermal analysis that studies the on chip temperature distribution in order to improve the accuracy of existing method to account for on chip temperature gradients and perform a overall performance prediction and adjustment. A computational fluid dynamics analysis is used in this study to address non-uniform power distribution temperature calculation for high power integrated circuits. Example will be given and results will be discussed with highlighted conclusions.
引用
收藏
页码:1107 / 1111
页数:5
相关论文
共 12 条
[1]  
CHEN H, 1997, P INT S VLSI TECHN, P329
[2]  
Chen HH, 1997, DES AUT CON, P638, DOI 10.1145/266021.266307
[3]   Interconnect and circuit modeling techniques for full-chip power supply noise analysis [J].
Chen, HH ;
Neely, JS .
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY PART B-ADVANCED PACKAGING, 1998, 21 (03) :209-215
[4]  
CHENG YK, 1995 IEEE S CIRC SYS, V2, P1392
[5]  
CHENG YK, 1996 IEEE INT S CIRC, V4, P580
[6]  
CHIUEH H, 1998, CIRCUITS SYSTEMS, P779
[7]   Temperature gradient impact on electromigration failure in VLSI metallization [J].
Guo, WL ;
Li, ZG ;
Zhu, H ;
Zhang, W ;
Ji, YSYH ;
Shen, GD .
FOURTEENTH ANNUAL IEEE SEMICONDUCTOR THERMAL MEASUREMENT AND MANAGEMENT SYMPOSIUM, 1998, :122-127
[8]  
HONG BZ, 1997, INT J MICROCIRCUITS, V21, P137
[9]  
*INN RES INC, 2000, COMP 3D
[10]  
KAWASHIMA H, 1998, J JPN SOC SIMUL TECH, V17