Recent developments on DAC modelling, testing and standardization

被引：12
作者：
Balestrieri, E [1 ]
Daponte, P [1 ]
Rapuano, S [1 ]
机构：
[1] Univ Sannio, Dept Engn, I-82100 Benevento, Italy
来源：
MEASUREMENT | 2006年 / 39卷 / 03期
关键词：
DAC; architecture; modelling; testing; standards;
D O I：
10.1016/j.measurement.2005.11.007
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
In the last years the technology improvements of Digital-to-Analog Converters (DACs) has extended the use of digital techniques in a multitude of applications. Consequently, there is an increasing attention to DAC topics, from researchers and manufacturers. The paper is aimed at providing a metrological overview and the leading trends of the research in the field of DACs. (C) 2005 Elsevier Ltd. All rights reserved.
引用
收藏
页码：258 / 266
页数：9
相关论文
共 38 条
[1]   Mismatch and dynamic modeling of current sources in current-steering CMOS D/A converters:: An extended design procedure [J].
Albiol, M ;
González, JL ;
Alarcón, E .
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2004, 51 (01) :159-169
[2]  
Albrecht S, 2003, 2003 SOUTHWEST SYMPOSIUM ON MIXED-SIGNAL DESIGN, P71
[3]  
*AN DEV, 1986, AN TO DIG CONV HDB, P267
[4]  
Andersson KO, 2003, 2003 SOUTHWEST SYMPOSIUM ON MIXED-SIGNAL DESIGN, P32
[5]   On chip testing data converters using static parameters [J].
Arabi, K ;
Kaminska, B ;
Sawan, M .
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 1998, 6 (03) :409-419
[6]   A CMOS oversampling bandpass cascaded D/A converter with digital FIR and current-mode semi-digital filtering [J].
Barkin, DB ;
Lin, ACY ;
Su, DK ;
Wooley, BA .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2004, 39 (04) :585-593
[7]  
Bushnell M., 2000, ESSENTIALS ELECT TES
[8]   BIST scheme for DAC testing [J].
Chang, SJ ;
Lee, CL ;
Chen, JE .
ELECTRONICS LETTERS, 2002, 38 (15) :776-777
[9]  
CHEN T, 2003, P INT S CIRC SYST, V1, P973
[10]   A statistical methodology for the design of high-performance CMOS current-steering digital-to-analog converters [J].
Crippa, P ;
Turchetti, C ;
Conti, M .
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2002, 21 (04) :377-394
1234