Generalized closed-form models for pull-in analysis of micro cantilever beams subjected to partial electrostatic load

被引:19
作者
Do, Cuong [1 ]
Lishchynska, Maryna [1 ,2 ]
Delaney, Kieran [1 ]
Hill, Martin
机构
[1] Cork Inst Technol, Dept Elect Engn, NIMBUS Ctr Embedded Syst Res, Cork, Ireland
[2] Cork Inst Technol, Dept Math, Cork, Ireland
关键词
Static pull-in; Closed-form; Electrostatic actuators; Cantilever; Partial load; MEMS; SILICON; VOLTAGE;
D O I
10.1016/j.sna.2012.07.020
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This work presents a new approach for the pull-in analysis of micro cantilever beams subjected to partial electrostatic actuation. A novel generalized closed-form models for the pull-in instability position and pull-in voltage of a cantilever beam with partial overlap of the beam and fixed actuation electrode is developed. The model benefits from including the effect of non-uniform loading and the fringing field effect into consideration, therefore, no correction factor is required. The accuracy of the model is validated through comparison with Finite Element Method (FEM) simulation results and correlation to within 6.6% error is obtained. The model is also validated against other existing empirical and analytical models and is demonstrated to be of equal accuracy with a more generalized model framework. (C) 2012 Elsevier B.V. All rights reserved.
引用
收藏
页码:109 / 116
页数:8
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