Modeling and diagnosis of timed discrete event systems - A factory automation example

被引:0
作者
Chen, YL
Provan, G
机构
来源
PROCEEDINGS OF THE 1997 AMERICAN CONTROL CONFERENCE, VOLS 1-6 | 1997年
关键词
D O I
暂无
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Detection and identification of failures is a critical task in the automatic control of large and complex systems. In the realm of discrete event systems, Sampath et al. proposed a new approach to failure diagnosis that models the logical behavior of the considered system in terms of state machines and produces an extended observer called a diagnoser for computing diagnoses. We extend this approach to the diagnosis of timed discrete event systems whose temporal and logical behavior are modeled by a framework proposed by Brandin and Wonham. We use a simple real-world factory conveyor example to demonstrate our modeling and diagnosis approach.
引用
收藏
页码:31 / 36
页数:6
相关论文
empty
未找到相关数据