Study of Polymer Interfacial Entanglements and Adhesion by High-Resolution Scanning Electron Microscopy

被引:2
作者
Horiuchi, Shin [1 ]
机构
[1] Natl Inst Adv Ind Sci & Technol, Nanosyst Res Inst, Tsukuba, Ibaraki 3058565, Japan
关键词
Interface; Adhesion; Electron Microscopy; SEM; Fractography; Entanglement; Fracture; IMMISCIBLE POLYMERS; BLOCK-COPOLYMERS; GLASSY-POLYMERS; ENERGY; INTERDIFFUSION; FRACTURE; BLENDS; WIDTH;
D O I
10.1295/koron.69.326
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
High-resolution scanning electron microscopy with low acceleration voltage was performed for the investigation of entanglements at interfaces of glassy polymers. Polymer interfaces failed via chain pull-out produced a large number of nano-sized fibrils. We discussed the correlation between the nano-scale features of the fracture surfaces and interfacial entanglements for three different interfaces. The interfaces between polymethylmethacrylate and poly(styrene-acrylonitrile) random copolymer (PMMA/SAN), between identical polystyrene homopolymers (PS/PS), and between PS/PMMA interfaces reinforced with block copolymers were investigated. we found that the "nano-fibrils" produced during the fracture reflected the local entaglement structures formed at narrow interfaces comparable to the entaglement spacing.
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页码:326 / 333
页数:8
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