Stabilization and calibration of an ECDL system with a Michelson interferometer

被引:0
作者
Outumuro, I. [1 ]
Valencia, J. L. [1 ]
Diz-Bugarin, J. [2 ]
Estevez-Caride, I. [1 ]
Blanco, J. [2 ]
Dorrio, B. V. [2 ]
机构
[1] Lab Oficial Metrol Galicia, R&D Dept, Parque Tecnolox Galicia, Orense 32901, Spain
[2] Univ Vigo, Dept Appl Phys, Vigo 36310, Spain
来源
8TH IBEROAMERICAN OPTICS MEETING AND 11TH LATIN AMERICAN MEETING ON OPTICS, LASERS, AND APPLICATIONS | 2013年 / 8785卷
关键词
wavemeter; Michelson interferometer; external cavity diode laser; metrology; calibration; LASER WAVELENGTH; WAVEMETER; METER; COMPACT;
D O I
10.1117/12.2026295
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The experimental setup developed to stabilize a red diode laser using a mode-locking technique with a reference gas cell is presented. This system has an external cavity diode laser (ECDL) in a Littrow configuration and is used to calibrate gauge blocks. The electronic controller limits the bandwidth of the laser and does not allow the setup to establish the wavelength of the tuned iodine transition, which is needed to calculate the gauge block values. To solve this limitation, we have set up a laser wavemeter based on a two-beam scanning Michelson interferometer. The unknown wavelength is determined from the ratio of the number of fringes obtained by the He-Ne reference laser and our ECDL. This technique measures the laser wavelength with an accuracy of 1ppm. As the resolution of the system is influenced by the optical path length, the stability of the reference laser and the phase ratio of both lasers, an electronic Vernier counter is used to improve the accuracy of these values below 1ppm. The uncertainty evaluation is also presented.
引用
收藏
页数:6
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