The Effects of Hydrogen Iodide Back Surface Treatment on CdTe Solar Cells

被引:33
作者
Awni, Rasha A. [1 ,2 ,3 ]
Li, Deng-Bing [1 ,2 ,4 ,5 ]
Grice, Corey R. [1 ,2 ]
Song, Zhaoning [1 ,2 ]
Razooqi, Mohammed A. [1 ,2 ]
Phillips, Adam B. [1 ,2 ]
Bista, Sandip Singh [1 ,2 ]
Roland, Paul J. [1 ,2 ]
Alfadhili, Fadhil K. [1 ,2 ]
Ellingson, Randy J. [1 ,2 ]
Heben, Michael J. [1 ,2 ]
Li, Jian, V [6 ,7 ]
Yan, Yanfa [1 ,2 ]
机构
[1] Univ Toledo, Dept Phys & Astron, Toledo, OH 43606 USA
[2] Univ Toledo, Wright Ctr Photovolta Innovat & Commercializat PV, Toledo, OH 43606 USA
[3] Tikrit Univ, Coll Educ Pure Sci, Dept Phys, Tikrit 34001, Salahuddin, Iraq
[4] HUST, WNLO, Wuhan 430074, Hubei, Peoples R China
[5] HUST, Sch Opt & Elect Informat, Wuhan 430074, Hubei, Peoples R China
[6] Natl Cheng Kung Univ, Dept Aeronaut & Astronaut, Tainan 70101, Taiwan
[7] Texas State Univ, Engn & Commercializat Program, Dept Phys & Mat Sci, San Marcos, TX 78666 USA
基金
美国国家科学基金会;
关键词
admittance spectroscopy; CdTe solar cells; carrier density profiling; complex capacitance spectroscopy; HI etching; ADMITTANCE MEASUREMENTS; CONTACT; SPECTROSCOPY; EFFICIENCY; DEFECTS; LEVEL;
D O I
10.1002/solr.201800304
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
An appropriate electrical back contact in CdTe solar cells is crucial to achieving high power conversion efficiency. In this work, a facile back surface treatment method for CdTe solar cells using hydroiodic acid (HI) is developed, and the effects of HI etching on the CdTe surfaces investigated. The electrical properties of the CdTe absorber and interfaces are characterized by current-voltage, capacitance-voltage, admittance spectroscopy, and complex capacitance spectroscopy measurements. The HI-etched devices show slightly higher apparent carrier concentrations than the control devices, suggesting an increased copper doping in the CdTe absorber. The potential barrier height of the back contact is reduced from 0.430 to 0.368 eV after the HI-treatment, accompanied by reduced contact resistance and carrier recombination. Additionally, the HI-treatment eliminates a defect signature at 0.409 eV. The HI-treatment effects lead to improved power conversion efficiency through enhancement of the fill factor, the short circuit current, and open circuit voltage.
引用
收藏
页数:9
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