Failures in power-combining arrays

被引:23
作者
Rutledge, DB [1 ]
Cheng, NS
York, RA
Weikle, RM
De Lisio, MP
机构
[1] CALTECH, Dept Elect Engn, Pasadena, CA 91125 USA
[2] Univ Calif Santa Barbara, Dept Elect & Comp Engn, Santa Barbara, CA 93106 USA
[3] Univ Virginia, Dept Elect Engn, Charlottesville, VA 22903 USA
[4] Univ Hawaii Manoa, Dept Elect Engn, Honolulu, HI 96822 USA
关键词
graceful degradation; grid arrays; power combining; quasi-optics;
D O I
10.1109/22.775439
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We derive a simple formula for the change in output when a device fails in a power-combining structure with identical matched devices. The loss is written in terms of the scattering coefficient of the failed device and reflection coefficient of an input port in the combining network, We apply this formula to several power combiners, including arrays in free space and enclosed waveguide structures. Our simulations indicate the output power degrades gracefully as devices fail, which is in agreement with previously published results.
引用
收藏
页码:1077 / 1082
页数:6
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