Neutron Scattering and Its Application to Investigate Magnetic Thin Film Structures

被引：4

作者：

Saerbeck, Thomas ^{[1
]}

Klose, Frank ^{[1
]}

机构：

[1] Australian Nucl Sci & Technol Org, Menai, NSW 2234, Australia

来源：

IUMRS INTERNATIONAL CONFERENCE IN ASIA 2011 | 2012年 / 36卷

关键词：

Polarized neutron scattering; magnetism; thin films; multilayers;

D O I：

10.1016/j.proeng.2012.03.071

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

Neutron scattering techniques, in particular polarized neutron reflectometry (PNR), small-angle scattering and diffraction, are very powerful tools for characterizing the magnetic structures of artificially layered films from the micron down to the atomic scale. PNR experiments are able to resolve the depth distribution of magnetic moments, neutron diffraction allows an experimental measurement of atomic ferro-or antiferromagnetic order and neutron small-angle / off-specular scattering probes magnetic domain states of films with thicknesses on the nanoscale. This paper will review the current state-of-the-art and present striking examples that illustrate the usefulness of neutron scattering in magnetic thin film research. (C) 2011 Published by Elsevier Ltd. Selection and/or peer-review under responsibility of MRS-Taiwan

引用

页码：488 / 495

页数：8

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