Scanning tunneling spectroscopy on a carbon nanotube buckle

被引：0

作者：

Janssen, JW ^{[1
]}

Lemay, SG ^{[1
]}

van den Hout, M ^{[1
]}

Mooij, M ^{[1
]}

Kouwenhoven, LP ^{[1
]}

Dekker, C ^{[1
]}

机构：

[1] Delft Univ Technol, Dept Appl Phys, NL-2628 CJ Delft, Netherlands

来源：

ELECTRONIC PROPERTIES OF MOLECULAR NANOSTRUCTURES | 2001年 / 591卷

关键词：

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The topography and electronic structure of a semiconducting carbon nanotube with a,sharp bend is studied by scanning tunneling microscopy and spectroscopy. From the increased height it is concluded that the nanotube is 'buckled', i.e. collapsed due to very strong bending. Detailed spatially resolved spectroscopy measurements at the location of the buckle reveal a well-defined localized state inside the semiconducting gap. The spatial extent of this localized state is about 2 nanometers.

引用

页码：293 / 297

页数：5

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