C70 close-packed surfaces and single molecule void-formation by local electric field through a scanning tunneling microscope tip

被引：1

作者：

Ohta, Yohei ^{[1
]}

Mitsuhashi, Ryoji ^{[1
]}

Nouchi, Ryo ^{[2
]}

Fujiwara, Akihiko ^{[3
]}

Hino, Shojun ^{[4
]}

Kubozono, Yoshihiro ^{[1
]}

机构：

[1] Okayama Univ, Surface Sci Res Lab, Okayama 7008530, Japan

[2] Tohoku Univ, WPI Adv Inst Mat Res, Sendai, Miyagi 9808577, Japan

[3] Japan Adv Inst Sci & Technol, Nomi, Ishikawa 9231192, Japan

[4] Ehime Univ, Dept Mat Sci & Biotechnol, Matsuyama, Ehime 7908577, Japan

来源：

APPLIED PHYSICS LETTERS | 2009年 / 94卷 / 04期

关键词：

evaporation; fullerenes; nanostructured materials; scanning tunnelling microscopy; silicon; voids (solid); SI(100)2X1 SURFACE; C-60; MOLECULES; STM;

D O I：

10.1063/1.3075959

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A C-70 close-packed surface was formed by a heating of the Si surface, which is covered with C-70 molecules. The close-packed surface is assigned to high-temperature hexagonal close-packed phase. The stability of C-70 close-packed surface and formation of nanometer scale structures are studied by the application of local electric field to the close-packed surface. An application of local electric field from scanning tunneling microscope tip to the C-70 close-packed surface caused molecular scale evaporation. The application of local electric field near strain in the surface produced a very large void by an evaporation of more than 20 of C-70 molecules.

引用

页数：3