Segment delay faults: A new fault model

被引：53
|
作者：
Heragu, K [1 ]
Patel, JH [1 ]
Agrawal, VD [1 ]
机构：
[1] UNIV ILLINOIS,CTR RELIABLE & HIGH PERFORMANCE COMP,URBANA,IL 61801
来源：
14TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS | 1996年
关键词：
D O I：
10.1109/VTEST.1996.510832
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
引用
收藏
页码：32 / 39
页数：8
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