Real-time vibration amplitude and phase imaging with heterodyne interferometry and correlation image sensor

被引:1
作者
Sato, Seichi [1 ]
Kurihara, Toru [1 ]
Ando, Shigeru [1 ]
机构
[1] Univ Tokyo, Tokyo 1138654, Japan
来源
INTERFEROMETRY XIV: TECHNIQUES AND ANALYSIS | 2008年 / 7063卷
关键词
heterodyne interferometry; vibration measurement; correlation image sensor;
D O I
10.1117/12.794168
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We propose a new out-of-plane vibration imaging technique for micro-structured solid-state devices such as MEMS (micro-electro mechanical systems) microphones or resonators. The technique is based on the longitudinally scanning optical interferometry and an integrated image sensor device which we call the correlation image sensor (CIS). The CIS is able to extract an arbitrary frequency, component from time-varying incident light and produce a complex correlation image including amplitude and phase ill addition to a conventional intensity image. In heterodyne interferometry of vibrating objects, the vibration information is encoded ill several frequency components generated by mutual modulation of longitudinal scan and vibration. In this paper, combination of newly, developed multi-channel CIS and the scanning heterodyne technique enable its to obtain the multiple frequency components simultaneously, and reconstruct the vibration amplitude and phase distributions in real-time. As all example, vibration modes of a MEMS acoustic sensor are shown to be reconstructed at, video rate. A theoretical possibility for the imaging of higher than GHz vibration combining other optical heterodyne techniques is also discussed.
引用
收藏
页数:8
相关论文
共 8 条
[1]   Correlation image sensor: Two-dimensional matched detection of amplitude-modulated light [J].
Ando, S ;
Kimachi, A .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2003, 50 (10) :2059-2066
[2]   Characterization of the static and dynamic behaviour of M(O)EMS by optical techniques: status and trends [J].
Bosseboeuf, A ;
Petitgrand, S .
JOURNAL OF MICROMECHANICS AND MICROENGINEERING, 2003, 13 (04) :S23-S33
[3]   Determination of fringe order in white-light interference microscopy [J].
de Groot, P ;
de Lega, XC ;
Kramer, J ;
Turzhitsky, M .
APPLIED OPTICS, 2002, 41 (22) :4571-4578
[4]   SURFACE PROFILING BY ANALYSIS OF WHITE-LIGHT INTERFEROGRAMS IN THE SPATIAL-FREQUENCY DOMAIN [J].
DEGROOT, P ;
DECK, L .
JOURNAL OF MODERN OPTICS, 1995, 42 (02) :389-401
[5]   Fast surface profiler by white-light interferometry by use of a new algorithm based on sampling theory [J].
Hirabayashi, A ;
Ogawa, H ;
Kitagawa, K .
APPLIED OPTICS, 2002, 41 (23) :4876-4883
[6]   Wide frequency range measurements of absolute phase and amplitude of vibrations in micro- and nanostructures by optical interferometry [J].
Martinussen, Hanne ;
Aksnes, Astrid ;
Engan, Helge E. .
OPTICS EXPRESS, 2007, 15 (18) :11370-11384
[7]  
NOVAK E, 2003, P ICMENS 03, P53902
[8]   Simultaneous mapping of phase and amplitude of MEMS vibrations by microscopic interferometry with stroboscopic illumination [J].
Petitgrand, S ;
Bosseboeuf, A .
MICROSYSTEMS ENGINEERING: METROLOGY AND INSPECTION III, 2003, 5145 :33-44