Si/S1-xGex/Si-based quantum wells infrared photodetector operating at 1.55 μm

被引:2
作者
Sfina, N. [1 ]
Lazzari, J. -L. [2 ]
Said, M. [1 ]
机构
[1] Fac Sci Monastir, Lab Mat Condensee & Nanosci LMCN, Dept Phys, Monastir 5019, Tunisia
[2] Aix Marseille Univ, Ctr Interdisciplinaire Nanosci Marseille CINaM, UPR 3118, CNRS, F-13288 Marseille 9, France
关键词
Strained SiGe/Si; Band structure engineering; Infrared photodetectors; Dark current characteristics; SIGE; PHOTOLUMINESCENCE; SEMICONDUCTOR;
D O I
10.1016/j.spmi.2012.06.031
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
A quantum well infrared photodetector consisting of self-assembled type II SiGe/Si based quantum wells operating around 1.55 mu m at room temperature has been investigated. The Si1-yGey/Si/Si1-xGex/Si/Si1-yGey stack results in a 'W' like profiles of the conduction and valence bands strain-compensated in the two low absorption windows of silica fibers infrared photodetectors have been proposed. Such computations have been used for the study of the p-i-n infrared photodetectors operating, around (1.3-1.55 mu m) at room temperature. The quantum transport properties of electrons and holes were approved with Schrodinger and kinetic equations resolved self-consistently with the Poisson equation. The theoretical performances of the photodetector were carried out such as the dark current mechanisms, the temperature dependence of normalized dark current and the zero-bias resistance area product (R(0)A). (C) 2012 Elsevier Ltd. All rights reserved.
引用
收藏
页码:901 / 912
页数:12
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