A 10 mK scanning tunneling microscope operating in ultra high vacuum and high magnetic fields

被引:71
作者
Assig, Maximilian [1 ]
Etzkorn, Markus [1 ]
Enders, Axel [1 ]
Stiepany, Wolfgang [1 ]
Ast, Christian R. [1 ]
Kern, Klaus [1 ,2 ]
机构
[1] Max Planck Inst Festkorperforsch, D-70569 Stuttgart, Germany
[2] Ecole Polytech Fed Lausanne, Inst Phys Mat Condensee, CH-1015 Lausanne, Switzerland
关键词
MILLIKELVIN TEMPERATURE-RANGE; CERMET RESISTORS; SUPERCONDUCTIVITY; THERMOMETERS; SPECTROSCOPY; FILMS; GAP;
D O I
10.1063/1.4793793
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We present design and performance of a scanning tunneling microscope (STM) that operates at temperatures down to 10 mK providing ultimate energy resolution on the atomic scale. The STM is attached to a dilution refrigerator with direct access to an ultra high vacuum chamber allowing in situ sample preparation. High magnetic fields of up to 14 T perpendicular and up to 0.5 T parallel to the sample surface can be applied. Temperature sensors mounted directly at the tip and sample position verified the base temperature within a small error margin. Using a superconducting Al tip and a metallic Cu(111) sample, we determined an effective temperature of 38 +/- 1 mK from the thermal broadening observed in the tunneling spectra. This results in an upper limit for the energy resolution of Delta E = 3.5k(B)T = 11.4 +/- 0.3 mu eV. The stability between tip and sample is 4 pm at a temperature of 15 mK as demonstrated by topography measurements on a Cu(111) surface. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4793793]
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页数:9
相关论文
共 47 条
[1]  
Affronte M, 1997, J LOW TEMP PHYS, V109, P461
[2]  
[Anonymous], 2013, Attocube Systems AG
[3]  
Assig M., 2011, THESIS
[4]  
AST CR, 2008, REV SCI INSTRUM, V79
[5]   DESIGN OF RUO2-BASED THERMOMETERS FOR THE MILLIKELVIN TEMPERATURE-RANGE [J].
BATKO, I ;
FLACHBART, K ;
SOMORA, M ;
VANICKY, D .
CRYOGENICS, 1995, 35 (02) :105-108
[6]   7X7 RECONSTRUCTION ON SI(111) RESOLVED IN REAL SPACE [J].
BINNIG, G ;
ROHRER, H ;
GERBER, C ;
WEIBEL, E .
PHYSICAL REVIEW LETTERS, 1983, 50 (02) :120-123
[7]   TUNNELING THROUGH A CONTROLLABLE VACUUM GAP [J].
BINNIG, G ;
ROHRER, H ;
GERBER, C ;
WEIBEL, E .
APPLIED PHYSICS LETTERS, 1982, 40 (02) :178-180
[8]   SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY [J].
BINNING, G ;
ROHRER, H ;
GERBER, C ;
WEIBEL, E .
PHYSICAL REVIEW LETTERS, 1982, 49 (01) :57-61
[9]  
Chen C. J., 1993, Introduction to Scanning Tunneling Microscopy
[10]   Review of temperature measurement [J].
Childs, PRN ;
Greenwood, JR ;
Long, CA .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2000, 71 (08) :2959-2978