Nitrogen doped p-type SnO thin films deposited via sputtering

被引:23
作者
Kim, Y. [2 ]
Jang, J. H.
Kim, J. S.
Kim, S. D. [3 ]
Kim, S. E. [1 ]
机构
[1] Seoul Natl Univ Sci & Technol, Grad Sch NID Fus Technol, Seoul 139743, South Korea
[2] Microsyst Packaging Ctr, Seoul 139743, South Korea
[3] Seoul Natl Univ Sci & Technol, Sch Mech Design & Automat Engn, Seoul 139743, South Korea
来源
MATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS | 2012年 / 177卷 / 16期
基金
新加坡国家研究基金会;
关键词
Tin oxide; Sputtering; Nitrogen; TIN OXIDE; PHASE;
D O I
10.1016/j.mseb.2012.01.011
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
p-Type SnO thin films were fabricated via reactive RF magnetron sputtering on borosilicate substrates with an Sn target and Ar/O-2/N-2 gas mixture. The undoped SnO thin film consisted of a polycrystalline SnO phase with a preferred (101) orientation: however, with nitrogen doping, the preferred orientation was suppressed and the grain size decreased. The electrical conductivity of the undoped SnO thin films demonstrated a relatively low p-type conductivity of 0.05 Omega(-1) cm(-1) and it was lowered slightly with nitrogen doping to 0.039 Omega(-1) cm(-1). The results of the X-ray photoelectron spectroscopy suggested that the nitrogen doping created donor defects in the SnO thin films causing lower electrical conductivity. Lastly, both the undoped and doped SnO thin films had poor optical transmittance in the visible range. (C) 2012 Elsevier B.V. All rights reserved.
引用
收藏
页码:1470 / 1475
页数:6
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