Effects of irregular two-dimensional and three-dimensional surface roughness in turbulent channel flows

Wall-resolved Large Eddy Simulation of fully developed turbulent channel flows over two different rough surfaces is performed to investigate on the effects of irregular 2D and 3D roughness on the turbulence. The two geometries are obtained through the superimposition of sinusoidal functions having random amplitudes and different wave lengths. In the 2D configuration the irregular shape in the longitudinal direction is replicated in the transverse one, while in the 3D case the sinusoidal functions are generated both in streamwise and spanwise directions. Both channel walls are roughened in such a way as to obtain surfaces with statistically equivalent roughness height, but different shapes. In order to compare the turbulence properties over the two rough walls and to analyse the differences with a smooth wall, the simulations are performed at the same Reynolds number Re-tau = 395. The same mean roughness height h = 0.05 delta (delta the half channel height) is used for the rough walls. The roughness function obtained with the 3D roughness is larger than in the 2D case, although the two walls share the same mean height. Thus, the considered irregular 3D roughness is more effective in reducing the flow velocity with respect to the 20 roughness, coherently with the literature results that identified a clear dependence of the roughness function on the effective slope (see Napoli et al. (2008)), higher in the generated 3D rough wall. The analysis of higher-order statistics shows that the effects of the roughness, independently on its two- or three-dimensional shape, are mainly confined in the inner region, supporting the Townsend's wall similarity hypothesis. The tendency towards the isotropization is investigated through the ratio between the resolved Reynolds stress components, putting in light that the 3D irregular rough wall induces an higher reduction of the anisotropy, with respect to the 2D case. (C) 2012 Elsevier Inc. All rights reserved.