Development of achromatic full-field X-ray microscopy with compact imaging mirror system

被引:1
|
作者
Matsuyama, S. [1 ]
Emi, Y. [1 ]
Kino, H. [1 ]
Sano, Y. [1 ]
Kohmura, Y. [2 ]
Tamasaku, K. [2 ]
Yabashi, M. [2 ]
Ishikawa, T. [2 ]
Yamauchi, K. [1 ,3 ]
机构
[1] Osaka Univ, Grad Sch Engn, Dept Precis Sci & Technol, 2-1 Yamada Oka, Suita, Osaka 5650871, Japan
[2] RIKEN, SPring 8, Mikazuki, Hyogo 6795148, Japan
[3] Osaka Univ, Grad Sch Engn, Res Ctr Ultra Precis Sci & Technol, Osaka 5650871, Japan
来源
X-RAY NANOIMAGING: INSTRUMENTS AND METHODS | 2013年 / 8851卷
基金
日本科学技术振兴机构;
关键词
advanced Kirkpatrick-Baez optics; Wolter mirror; full-field X-ray microscopy; X-ray mirror; OPTICS; INTERFEROMETRY;
D O I
10.1117/12.2023152
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Compact advanced Kirkpatrick-Baez optics are used to construct a microscope that is easy to align and robust against vibrations and thermal drifts. The entire length of the imaging mirror system is 286 mm, which is 34% shorter than the previous model. A spatial resolution test is performed in which magnified bright-field images of a pattern are taken with an X-ray camera at an energy of 10 keV at the BL29XUL beamline of SPring-8. A line-and-space pattern having a 50-nm width could be resolved, although the image contrast is low.
引用
收藏
页数:8
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