Rapid low dose electron tomography using a direct electron detection camera

被引：56

作者：

Migunov, Vadim ^{[1
,2
]}

Ryll, Henning ^{[3
]}

Zhuge, Xiaodong ^{[4
]}

Simson, Martin ^{[5
]}

Strueder, Lothar ^{[3
,6
]}

Batenburg, K. Joost ^{[4
,7
,8
]}

Houben, Lothar ^{[1
,2
]}

Dunin-Borkowski, Rafal E. ^{[1
,2
]}

机构：

[1] Forschungszentrum Julich, Ernst Ruska Ctr Microscopy & Spect Elect, D-52425 Julich, Germany

[2] Forschungszentrum Julich, Peter Grunberg Inst, D-52425 Julich, Germany

[3] PNSensor GmbH, D-81739 Munich, Germany

[4] Ctr Wiskunde & Informat, NL-1090 GB Amsterdam, Netherlands

[5] PNDetector GmbH, D-81739 Munich, Germany

[6] Univ Siegen, D-57068 Siegen, Germany

[7] Leiden Univ, Math Inst, NL-2300 RA Leiden, Netherlands

[8] Univ Antwerp, iMinds Vis Lab, Antwerp, Belgium

来源：

SCIENTIFIC REPORTS | 2015年 / 5卷

关键词：

MICROTOMOGRAPHY;

D O I：

10.1038/srep14516

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

We demonstrate the ability to record a tomographic tilt series containing 3487 images in only 3.5 s by using a direct electron detector in a transmission electron microscope. The electron dose is lower by at least one order of magnitude when compared with that used to record a conventional tilt series of fewer than 100 images in 15-60 minutes and the overall signal-to-noise ratio is greater than 4. Our results, which are illustrated for an inorganic nanotube, are important for ultra-low-dose electron tomography of electron-beam-sensitive specimens and real-time dynamic electron tomography of nanoscale objects with sub-ms temporal resolution.

引用

页数：5

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