A new method for evaluating the size of plate-like precipitates by small-angle scattering

被引：47

作者：

De Geuser, Frederic ^{[1
]}

Bley, Francoise ^{[1
]}

Deschamps, Alexis ^{[1
]}

机构：

[1] Grenoble INP CNRS UJF, SIMAP, F-38402 St Martin Dheres, France

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 2012年 / 45卷

关键词：

plate-like precipitates; small-angle scattering; textured polycrystalline samples; X-RAY-SCATTERING; SINGLE; KINETICS; ALLOYS; GROWTH;

D O I：

10.1107/S0021889812039891

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

A methodology is presented for extracting the thickness and length of plate-like precipitates from streaking that appears in the small-angle scattering pattern of moderately textured polycrystalline samples. This methodology builds upon existing work on single crystals but is extended to polycrystals through a modeling of the streaking misalignment distribution. It is also shown that it is essential to take into account the Ewald sphere curvature. The protocol is applied to an in situ small-angle X-ray scattering study of the transition between ?' and T1 in an AlLiCu system, where the contributions of both phases are well separated, and the size, volume fraction and number density are monitored.

引用

页码：1208 / 1218

页数：11

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