Local electrical characterization of cadmium telluride solar cells using low-energy electron beam

被引：35

作者：

Yoon, Heayoung P. ^{[1
,3
]}

Haney, Paul M. ^{[1
]}

Ruzmetov, Dmitry ^{[1
,3
]}

Xu, Hua ^{[1
,3
]}

Leite, Marina S. ^{[1
,3
]}

Hamadani, Behrang H. ^{[2
]}

Talin, A. Alec ^{[1
]}

Zhitenev, Nikolai B. ^{[1
]}

机构：

[1] NIST, Ctr Nanoscale Sci & Technol, Gaithersburg, MD 20899 USA

[2] NIST, Div Energy & Environm, Gaithersburg, MD 20899 USA

[3] Univ Maryland, Maryland Nanoctr, College Pk, MD 20742 USA

来源：

SOLAR ENERGY MATERIALS AND SOLAR CELLS | 2013年 / 117卷

关键词：

EBIC; CdTe; FIB; Grain boundary; Electron beam; Local characterization; MICROSCOPY;

D O I：

10.1016/j.solmat.2013.07.024

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

We investigate local electronic properties of cadmium telluride solar cells using electron beam induced current (EBIC) measurements with patterned contacts. EBIC measurements are performed with a spatial resolution as high as approximate to 20 nm both on the top surface and throughout the cross-section of the device, revealing a remarkable degree of electrical inhomogeneity near the p-n junction and enhanced carrier collection in the vicinity of grain boundaries (GB). Simulation results of low energy EBIC suggest that the band bending near a GB is downward, with a magnitude of at least 0.2 eV for the most effective current-collecting GBs. Furthermore, we demonstrate a new approach to investigate local open-circuit voltage by applying an external bias across electrical contact with a point electron-beam injection. The length scale of the nanocontacts is on the length scale of a single or a few grains, confining current path with highly localized photo-generated carriers. (C) 2013 Elsevier B.V. All rights reserved.

引用

页码：499 / 504

页数：6

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