Adaptive Charting Schemes Based on Double Sequential Probability Ratio Tests
被引:16
|
作者:
Li, Yan
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机构:
E China Normal Univ, Sch Finance & Stat, Shanghai 200241, Peoples R ChinaE China Normal Univ, Sch Finance & Stat, Shanghai 200241, Peoples R China
Li, Yan
[1
]
Pu, Xiaolong
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机构:
E China Normal Univ, Sch Finance & Stat, Shanghai 200241, Peoples R ChinaE China Normal Univ, Sch Finance & Stat, Shanghai 200241, Peoples R China
Pu, Xiaolong
[1
]
Tsung, Fugee
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机构:
Hong Kong Univ Sci & Technol, Dept Ind Engn & Logist Management, Kowloon, Hong Kong, Peoples R ChinaE China Normal Univ, Sch Finance & Stat, Shanghai 200241, Peoples R China
Tsung, Fugee
[2
]
机构:
[1] E China Normal Univ, Sch Finance & Stat, Shanghai 200241, Peoples R China
[2] Hong Kong Univ Sci & Technol, Dept Ind Engn & Logist Management, Kowloon, Hong Kong, Peoples R China
double sequential probability ratio test (2-SPRT);
control charts;
variable sampling size (VSS);
average time to signal (ATS);
average number of observations to signal (ANOS);
Gaussian quadrature;
VARIABLE SAMPLING INTERVALS;
KIEFER-WEISS PROBLEM;
DESIGN;
SIZE;
D O I:
10.1002/qre.938
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
Sequential probability ratio test (SPRT) control charts are shown to be able to detect most shifts in the mean or proportion substantially faster than conventional charts such as CUSUM charts. However, they are limited in applications because of the absence of the upper bound on the sample size and possibly large sample numbers during implementation. The double SPRT (2-SPRT) control chart, which applies a 2-SPRT at each sampling point, is proposed in this paper to solve some of the limitations of SPRT charts. Approximate performance measures of the 2-SPRT control chart are obtained by the backward method with the Gaussian quadrature in a computer program. On the basis of two industrial examples and simulation comparisons, we conclude that the 2-SPRT chart is competitive in that it is more sensitive and economical for small shifts and has advantages in administration because of fixed sampling points and a proper upper bound on the sample size. Copyright (C) 2008 John Wiley & Sons, Ltd.
机构:
East China Jiaotong Univ, Coll Elect & Automat Engn, Nanchang 330013, Jiangxi, Peoples R ChinaEast China Jiaotong Univ, Coll Elect & Automat Engn, Nanchang 330013, Jiangxi, Peoples R China
Ding, Qingfeng
Liu, Mengxia
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East China Jiaotong Univ, Coll Elect & Automat Engn, Nanchang 330013, Jiangxi, Peoples R ChinaEast China Jiaotong Univ, Coll Elect & Automat Engn, Nanchang 330013, Jiangxi, Peoples R China
Liu, Mengxia
Deng, Yuqian
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机构:
East China Jiaotong Univ, Coll Elect & Automat Engn, Nanchang 330013, Jiangxi, Peoples R ChinaEast China Jiaotong Univ, Coll Elect & Automat Engn, Nanchang 330013, Jiangxi, Peoples R China
机构:
Harbin Engn Univ, Coll Informat & Commun Engn, Harbin 150001, Peoples R ChinaHarbin Engn Univ, Coll Informat & Commun Engn, Harbin 150001, Peoples R China
Xue, Rui
Zhao, Mingfei
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机构:
Harbin Engn Univ, Coll Informat & Commun Engn, Harbin 150001, Peoples R ChinaHarbin Engn Univ, Coll Informat & Commun Engn, Harbin 150001, Peoples R China
Zhao, Mingfei
Tang, Huaiyu
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机构:
China Res Inst Radiowave Propagat, Xinxiang 453000, Henan, Peoples R ChinaHarbin Engn Univ, Coll Informat & Commun Engn, Harbin 150001, Peoples R China