Silicon photonic phase interrogators for on-chip calibration of optical phased arrays

被引:5
|
作者
Kjellman, Jon Oyvind [1 ]
Prost, Mathias [1 ]
Marinins, Aleksandrs [1 ]
Tyagi, Hemant Kumar [1 ]
Kongnyuy, Tangla David [1 ]
Kerman, Sarp [1 ]
Troia, Benedetto [1 ]
Figeys, Bruno [1 ]
Dwivedi, Sarvagya [1 ]
Dahlem, Marcus S. [1 ]
Soussan, Philippe [1 ]
Rottenberg, Xavier [1 ]
Jansen, Roelof [1 ]
机构
[1] IMEC, Kapeldreef 75, B-3001 Heverlee, Belgium
关键词
phase interrogator; phase calibration; optical phased array; silicon photonics;
D O I
10.1117/12.2546542
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Correcting phase errors is key to building low cost, high performance integrated optical phased arrays for mass-market applications such as automotive lidar. In this work, we present a phase interrogator component for optical phased arrays which enables the phase error to be measured immediately before the output array of optical emitters. A 32-element silicon/silicon nitride optical phased array is realized in a dual layer photonics stack to verify the component performance. Silicon enables high density integration of photonic components and the phase interrogator has a compact design which fits between waveguides with a separation of 2.5 mu m. The phase interrogators enable correction of the beam without any measurement or evaluation of the far-field.
引用
收藏
页数:7
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