Simulation and experimental studies of impurity release from tungsten exposed to edge plasmas in TEXTOR-94

被引:7
|
作者
Ohya, K
Tanabe, T
Wada, M
Ohgo, T
Philipps, V
Unterberg, B
Pospieszczyk, A
Schweer, B
Huber, A
Noda, N
机构
[1] Univ Tokushima, Fac Engn, Tokushima 7708506, Japan
[2] Nagoya Univ, Ctr Integrated Res Sci & Engn, Nagoya, Aichi 4648603, Japan
[3] Doshisha Univ, Dept Elect, Kyoto 6100394, Japan
[4] Fukuoka Univ Educ, Dept Phys, Fukuoka 8114192, Japan
[5] Forschungszentrum Julich, Inst Plasmaphys, EURATOM Assoc, D-52425 Julich, Germany
[6] Natl Inst Fus Sci, Gifu 5095292, Japan
关键词
Monte-Carlo simulation; plasma-material interaction; TEXTOR-94; tungsten; carbon; impurity release; prompt redeposition;
D O I
10.1016/S0168-583X(98)01024-6
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Particle release from a W test limiter exposed to deuterium edge plasmas, containing impurities C and O, in the tokamak TEXTOR-94 is studied both experimentally and theoretically by means of Monte-Carlo simulations. The simulation model combines the dynamic composition change in the surface layer with the transport of released particles in the plasma. The release of W impurities from the limiter is strongly suppressed by prompt redeposition, whereas low-Z impurities (C and O) and D are much less influenced. Experimentally observed radial distributions of WI and CII line intensities in front of the limiter can be explained by physical sputtering of W and deposited C, respectively, in addition to high-energy reflection of impurity C ions. On the other hand, the CII line emission observed in front of graphite as a limiter is attributed to many low-energy (similar to 0.1 eV) atoms probably due to chemical sputtering by impact of D ions, which is strongly suppressed by deposition of high-Z impurities, such as W. The observed D gamma line emission indicates an important contribution of high-energy reflection to the release of D atoms from the W limiter, in addition to a large contribution of low-energy re-emission. (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:354 / 360
页数:7
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