Measurement Time Reduction Technique for Input Referred Noise of Dynamic Comparator

被引：0

作者：

Ishijima, Yuki ^{[1
]}

Nakagawa, Shuya ^{[1
]}

Ishikuro, Hiroki ^{[1
]}

机构：

[1] Keio Univ, Dept Elect & Elect Engn, Kohoku Ku, 3-14-1 Hiyoshi, Yokohama, Kanagawa 2238522, Japan

来源：

PROCEEDINGS OF THE 2018 IEEE INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES (ICMTS) | 2018年

关键词：

dynamic comparator; input referred noise; binary search; DAC;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Time reduction technique for the measurement of input referred noise of dynamic comparator is presented. By using binary search technique, the proposed method can reduce the measurement time of comparator input referred noise to (log2n)/n, where n is a required resolution. Experimental results obtained by the developed measurement system shows good correspondence with the simulated input referred noise.

引用

页码：202 / 205

页数：4

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