Robust extraction of the frequency-dependent characteristic impedance of transmission lines using one-port TDR measurements

被引：0

作者：

Kim, W ^{[1
]}

Lee, SH ^{[1
]}

Swaminathan, M ^{[1
]}

Tummala, RR ^{[1
]}

机构：

[1] Georgia Inst Technol, Packaging Res Ctr, Sch Elect & Comp Engn, Atlanta, GA 30332 USA

来源：

ELECTRICAL PERFORMANCE OF ELECTRONIC PACKAGING | 2001年

关键词：

D O I：

10.1109/EPEP.2001.967624

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

This paper discusses a method for extracting the frequency dependent characteristic impedance of transmission lines from Time Domain Reflectometry (TDR) measurements using an Open, Short, Load, and Shortline calibration. The frequency dependent behavior of transmission lines was successfully captured using this method. Two types of transmission lines were measured using this method namely, thick metal transmission lines in Printed Wiring Board (PWB) and thin transmission lines in MCM-L technology.

引用

页码：113 / 116

页数：4

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