Concatenation of Functional Test Subsequences for Improved Fault Coverage and Reduced Test Length

被引：12
作者：
Pomeranz, Irith [1 ]
机构：
[1] Purdue Univ, Sch Elect & Comp Engn, W Lafayette, IN 47907 USA
来源：
IEEE TRANSACTIONS ON COMPUTERS | 2012年 / 61卷 / 06期
关键词：
Functional test sequences; stuck-at faults; synchronous sequential circuits; transition faults;
D O I：
10.1109/TC.2011.107
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
Functional test sequences have several advantages over structural tests when they are applied at-speed. A large pool of functional test sequences may be available for a circuit due to the application of a simulation-based design verification process. This paper describes a versatile procedure that uses a pool of functional test sequences as a basis for forming a single compact functional test sequence that achieves the same or higher gate-level fault coverage than the given pool. The procedure extracts test subsequences from the test sequences in the pool and concatenates them to form a single test sequence. It also employs an enhanced static test compaction process aimed at improving the fault coverage in addition to reducing the test sequence length.
引用
收藏
页码：899 / 904
页数：6
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