Mueller matrix for an ellipsoidal mirror

被引：5

作者：

Rodriguez-Herrera, O. G. ^{[1
]}

Bruce, N. C. ^{[1
]}

机构：

[1] Univ Nacl Autonoma Mexico, Ctr Ciencias Aplicadas & Desarrollo Tecnol, Mexico City 04510, DF, Mexico

来源：

OPTICAL ENGINEERING | 2006年 / 45卷 / 05期

关键词：

mueller matrix; polarization; ellipsometry;

D O I：

10.1117/1.2203368

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Calculations and measurements of the Mueller matrix of an ellipsoidal mirror have been performed. In the calculations we have considered six different input polarization states to obtain a system of 24 equations, of which only 16 are independent, to yield 16 expressions for the elements of the Mueller matrix. We have compared experimental measurements of the elements of the matrix with the theoretical results. Some differences between theory and experiment have been found. Thess differences suggest that Mueller matrix ellipsometry could be used as an optical testing method. (C) 2006 Society of Photo-Optical Instrumentation Engineers.

引用

页数：7

共 11 条

[1] Mueller matrix determination for one-dimensional rough surfaces with a reduced number of measurements [J].