Change in dielectric properties of sweet potato during microwave drying

被引：10

作者：

Lee, Dongyoung ^{[1
]}

Mo, Changyeun ^{[2
]}

Lee, Chang Joo ^{[3
]}

Lee, Seung Hyun ^{[1
]}

机构：

[1] Chungnam Natl Univ, Dept Biosyst Machinery Engn, Coll Agr & Life Sci, 99 Daehak Ro, Daejeon 34134, South Korea

[2] Rural Dev Adm, Natl Inst Agr Sci, 310 Nonsaengmyeong Ro, Jeonju Si 54875, Jeollabuk Do, South Korea

[3] Wonkwang Univ, Dept Food Sci & Biotechnol, Coll Life Resource Sci, 460 Iksandae Ro, Iksan 54538, Jeonbuk, South Korea

来源：

FOOD SCIENCE AND BIOTECHNOLOGY | 2019年 / 28卷 / 03期

关键词：

Sweet potato; Microwave drying; Drying models; Dielectric properties; QUALITY; TEMPERATURE; FRUITS;

D O I：

10.1007/s10068-018-0522-y

中图分类号：

TS2 [食品工业];

学科分类号：

0832 ;

摘要：

Sweet potato slices and strips (thickness of 6 and 9mm, respectively) as single layer were dried at different microwave power levels (90W to 900W) in order to determine the effect of microwave power and sample shape on drying characteristics. Dielectric properties of sweet potato slices were measured during microwave drying. Drying time for both samples was decreased with increase in microwave power, and drying time of strips was longer than slices inthe microwave power range between 90 and 720W. Page model was suitable for describing experimental drying data regardless of microwave power and shape of sweet potato samples. Dielectric properties of sweet potato slices were decreased with a decrease in moisture content. The change in dielectric properties of sweet potato slices could be predicted by Henderson and Pabis model and could be applied to estimate the change in moisture content of sweet potato during microwave drying.

引用

页码：731 / 739

页数：9

共 31 条

[1] Peeling, drying temperatures, and sulphite-treatment affect physicochemical properties and nutritional quality of sweet potato flour [J].