Measurement of displacement and distance with a polarization phase shifting folded Twyman Green interferometer

被引:3
作者
Chatterjee, Sanjib [1 ]
Kumar, Y. Pavan [1 ]
机构
[1] Raja Ramanna Ctr Adv Technol, Dept Atom Energy, Indore 452013, Madhya Pradesh, India
关键词
SYSTEM;
D O I
10.1364/AO.54.009839
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A Sagnac interferometer (SI), consisting of a polarization beam splitter (PBS), along with two equally spaced plane mirrors that are inclined at 45 degrees to each other, is transformed into a folded Twyman Green interferometer (TGI) by placing a mirrored parallel plate (MPP) into the hypotenuse arm of the SI. The converging input beam produced by a telescope objective (TO) is split into reflected (s-polarized) and transmitted (p-polarized) components by the PBS. The p- and s-polarized focal spots are made to fall on the mirrored end surfaces of the parallel plate (PP). The retroreflected p- and s-polarized beams become collimated after passing through the TO. A linear shift of the PP in either (longitudinal) direction alters the positions of the p- and s-polarized focal spots and results in a set of converging and diverging spherical wavefronts that interfere to form concentric circular fringes. We applied polarization phase-shifting interferometry to obtain the optical path difference (OPD) variation of the interference field. The displacement is calculated from the OPD variation. A validation experiment has been carried out by introducing known shifts to the PP. The setup can be used for displacement as well as distance measurement. (C)2015 Optical Society of America
引用
收藏
页码:9839 / 9843
页数:5
相关论文
共 19 条
  • [1] Femtosecond frequency comb based distance measurement in air
    Balling, Petr
    Kren, Petr
    Masika, Pavel
    van den Berg, S. A.
    [J]. OPTICS EXPRESS, 2009, 17 (11): : 9300 - 9313
  • [2] Absolute interferometric distance measurements applying a variable synthetic wavelength
    Bechstein, KH
    Fuchs, W
    [J]. JOURNAL OF OPTICS-NOUVELLE REVUE D OPTIQUE, 1998, 29 (03): : 179 - 182
  • [3] Bourdet G. L., 1979, APPL OPTICS, V30, P4026
  • [4] Measurement of surface figure of plane polarization phase-shifting Fizeau optical surfaces with interferometer
    Chatterjee, Sanjib
    Kumar, Y. Pawan
    Bhaduri, Basanta
    [J]. OPTICS AND LASER TECHNOLOGY, 2007, 39 (02) : 268 - 274
  • [5] Creath K., 1988, Progress in optics. Vol.XXVI, P349, DOI 10.1016/S0079-6638(08)70178-1
  • [6] 3-COLOR LASER-DIODE INTERFEROMETER
    DEGROOT, P
    [J]. APPLIED OPTICS, 1991, 30 (25): : 3612 - 3616
  • [7] SYNTHETIC WAVELENGTH STABILIZATION FOR 2-COLOR LASER-DIODE INTERFEROMETRY
    DEGROOT, P
    KISHNER, S
    [J]. APPLIED OPTICS, 1991, 30 (28) : 4026 - 4033
  • [8] INTERFEROMETRIC LASER RANGEFINDER USING A FREQUENCY MODULATED DIODE-LASER
    DENBOEF, AJ
    [J]. APPLIED OPTICS, 1987, 26 (21): : 4545 - 4550
  • [9] A LOW-COST LASER INTERFEROMETER SYSTEM FOR MACHINE-TOOL APPLICATIONS
    DORSEY, A
    HOCKEN, RJ
    HOROWITZ, M
    [J]. PRECISION ENGINEERING-JOURNAL OF THE AMERICAN SOCIETY FOR PRECISION ENGINEERING, 1983, 5 (01): : 29 - 31
  • [10] UN-MODULATED BI-DIRECTIONAL FRINGE-COUNTING INTERFEROMETER SYSTEM FOR MEASURING DISPLACEMENT
    DOWNS, MJ
    RAINE, KW
    [J]. PRECISION ENGINEERING-JOURNAL OF THE AMERICAN SOCIETY FOR PRECISION ENGINEERING, 1979, 1 (02): : 85 - 88