On the RF Series Resistance Extraction of Nanoscale MOSFETs

被引：10

作者：

Choi, Gil-Bok ^{[1
]}

Hong, Seung-Ho ^{[2
]}

Jung, Sung-Woo

Jeong, Yoon-Ha ^{[1
,2
]}

机构：

[1] Pohang Univ Sci & Technol, Gyeongbuk 790784, South Korea

[2] NCNT, Gyeongbuk 790784, South Korea

来源：

IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS | 2008年 / 18卷 / 10期

关键词：

Extraction; modeling; metal oxide semiconductor field-effect transistor (MOSFET); radio frequency (RF); series resistance; small signal;

D O I：

10.1109/LMWC.2008.2003472

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A new extraction method of series resistance based on the radio frequency S-parameter measurement for sub -0.1 mu m, metal oxide semiconductor field-effect transistor is presented. The practical limit of conventional methods is analyzed from measurement and simulation. From this analysis, analytical expressions are derived, and linear regression techniques are used to extract the series resistances. The proposed method improves the accuracy and reduces the measurement frequency.

引用

页码：689 / 691

页数：3

共 10 条

[1] Chen JC, 2001, J OPT COMMUN, V22, P2, DOI 10.1515/JOC.2001.22.1.2
[2] On the high-frequency characteristics of substrate resistance in RF MOSFETs
Cheng, YH
Matloubian, M
[J]. IEEE ELECTRON DEVICE LETTERS, 2000, 21 (12) : 604 - 606
[3] MOSFET Modeling for RF IC design
Cheng, YH
Deen, MJ
Chen, CH
[J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2005, 52 (07) : 1286 - 1303
[4] High-frequency small signal AC and noise modeling of MOSFETs for RF IC design
Cheng, YH
Chen, CH
Matloubian, M
Deen, MJ
[J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2002, 49 (03) : 400 - 408
[5] JEON J, 2007, J SEMICOND TECH SCI, V7, P88
[6] A semianalytical parameter extraction of a SPICE BSIM3v3 for RF MOSFET's using S-parameters
Lee, S
Yu, HK
[J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2000, 48 (03) : 412 - 416
[7] A novel approach to extracting small-signal model parameters of silicon MOSFET's
Lee, S
Yu, HK
Kim, CS
Koo, JG
Nam, KS
[J]. IEEE MICROWAVE AND GUIDED WAVE LETTERS, 1997, 7 (03): : 75 - 77
[8] Accurate RF extraction method for resistances and inductances of sub-0.1 μm CMOS transistors
Lee, S
[J]. ELECTRONICS LETTERS, 2005, 41 (24) : 1325 - 1327
[9] Lovelace D, 1994, P IEEE MTT S INT MIC, P865
[10] On the RF extrinsic resistance extraction for partially-depleted SOI MOSFETs
Wang, Sheng-Chun
Su, Pin
Chen, Kun-Ming
Lin, Chien-Ting
Liang, Victor
Huang, Guo-Wei
[J]. IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, 2007, 17 (05) : 364 - 366

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