Salt Effects on the Structure of Water Probed by Attenuated Total Reflection Infrared Spectroscopy and Molecular Dynamics Simulations

被引:27
|
作者
Riemenschneider, Julian [1 ]
Holzmann, Joerg [1 ]
Ludwig, Ralf [1 ,2 ]
机构
[1] Univ Rostock, Phys Chem Abt, Inst Chem, D-18051 Rostock, Germany
[2] Univ Rostock, Leibniz Inst Katalyse, D-18059 Rostock, Germany
关键词
hydrogen bonds; IR spectroscopy; molecular dynamics; salt effect; water chemistry;
D O I
10.1002/cphc.200800571
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We study aqueous solutions of alkaline chlorides (NaCl, KCl, RbCl and CsCl) with a combination of attenuated total reflection infrared (ATR-IR) spectroscopy and molecular dynamics (MD) simulations using the TIP4P-Ew water model (Horn et al., J. Chem, Phys. 2004, 120, 9665), covering concentration ranges between 0.1 and 6 M. Spectral modifications in the OH stretch region are evaluated and correlated to the various salts and salt concentrations. By taking the difference spectra between the spectral line shapes of aqueous salt solutions and those of pure water, we specifically focus on the small quasi-"free OH" band appearing the highest wavenumbers in the spectra. This free-OH feature is found constantly at 3650 cm(-1) for all salts and salt concentrations, but it shows a characteristic intensity depending on the chosen cation. In the order from Na+ to Cs+, the free OH intensity decreases compared to that of pure water. To interpret the experimental results, we performed MD simulations for similar salt solutions. The experimentally observed effects can be correlated with structural alterations indicated by differences between the site-site pair correlation functions of water in aqueous salt solutions and those of pure water.
引用
收藏
页码:2731 / 2736
页数:6
相关论文
共 50 条
  • [41] INFRARED TOTAL REFLECTION SPECTROSCOPY OF ADSORBED MOLECULAR LAYERS
    SHAW, ESP
    ONEILL, JA
    OSGOOD, RM
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1988, 195 : 143 - PHYS
  • [42] Attenuated total reflection spectroscopy of frozen aqueous salt solutions and vapordeposited ice
    Michelsen, Rebecca
    Marrocco, Harley
    Searles, Keith
    Walker, Rachel
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2015, 249
  • [43] Thickness measurement of thin polymer films by total internal reflection Raman and attenuated total reflection infrared spectroscopy
    Kivioja, Antti O.
    Jaaskelainen, Anna-Stiina
    Ahtee, Ville
    Vuorinen, Tapani
    VIBRATIONAL SPECTROSCOPY, 2012, 61 : 1 - 9
  • [44] Infrared spectroscopy of high k thin layer by multiple internal reflection and attenuated total reflection
    Rochat, N
    Dabertrand, K
    Cosnier, V
    Zoll, S
    Besson, P
    Weber, U
    PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 0, NO 8, 2003, 0 (08): : 2961 - 2965
  • [45] ATTENUATED TOTAL REFLECTION SPECTROSCOPY OF BILAYERS AND MEMBRANES COATED ON INFRARED OPTICAL FIBERS
    WILSON, KJ
    BRAIMAN, MS
    BIOPHYSICAL JOURNAL, 1990, 57 (02) : A471 - A471
  • [46] Analysis of human menisci degeneration via infrared attenuated total reflection spectroscopy
    Wang, Pei
    Balko, Jonas
    Lu, Rui
    Lopez-Lorente, Angela I.
    Duerselen, Lutz
    Mizaikoff, Boris
    ANALYST, 2018, 143 (20) : 5023 - 5029
  • [47] Orientation measurements of clay minerals by polarized attenuated total reflection infrared spectroscopy
    Gregoire, Brian
    Dazas, Baptiste
    Hubert, Fabien
    Tertre, Emmanuel
    Ferrage, Eric
    Grasset, Laurent
    Petit, Sabine
    JOURNAL OF COLLOID AND INTERFACE SCIENCE, 2020, 567 (567) : 274 - 284
  • [48] Far infrared attenuated total reflection spectroscopy for investigating superlattice phonon parameters
    Hamilton, AA
    Dumelow, T
    Parker, TJ
    Smith, SRP
    JOURNAL OF PHYSICS-CONDENSED MATTER, 1996, 8 (42) : 8027 - 8039
  • [49] Far infrared attenuated total reflection spectroscopy for investigating superlattice phonon parameters
    Univ of Essex, Colchester, United Kingdom
    J Phys Condens Matter, 42 (8027-8039):
  • [50] Attenuated total reflection spectroscopy for infrared analysis of thin layers on a semiconductor substrate
    Rochat, N.
    Chabli, A.
    Bertin, F.
    Olivier, M.
    Vergnaud, C.
    Mur, P.
    1600, American Institute of Physics Inc. (91):