Ellipsometric study of quasi-monolayer InAs embedded in GaAs at the threshold of quantum-dot formation

被引:2
作者
Lee, H [1 ]
Park, YJ
Kim, EK
机构
[1] Kyung Hee Univ, Dept Phys, Suwon 449701, South Korea
[2] Kyung Hee Univ, Inst Nat Sci, Suwon 449701, South Korea
[3] Korea Inst Sci & Technol, Semicond Mat Res Lab, Seoul 130650, South Korea
关键词
spectroscopic ellipsometry; quantum dot; wetting laver; transitions; photoluminescence;
D O I
10.3938/jkps.40.716
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Using spectroscopic ellipsometry, we measured the pseudo-dielectric function of self-assembled InAs/GaAs quantum dots at the onset of quantum-dot nucleation at room temperature. from 0.8 to 6 eV. The nominal InAs coverage varied from 1 to 2.6 monolayers (ML). In addition to a quantum-dot-related feature. we observed two transitions near 1.34 an 1.38 eV, which arose from the InAs wetting layer. We fitted the dielectric function of the InAs wetting layer in the visible range by performing a multi-layer analysis and found a strong excitonic enhancement of the E-1 peak.
引用
收藏
页码:716 / 719
页数:4
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