Nonvacuum electrodeposition was used to prepare biaxially textured CeO2 and Sm-doped CeO2 coatings on Ni-W substrates. The samples were characterized by X-ray diffraction (including theta/2 theta, pole figures, Omega scans, and phi scans), atomic force microscopy, and Auger electron spectroscopy (AES). Pole-figure scans show that electrodeposited CeO2 and Sm-doped CeO2 on textured Ni-W (3 atom %) is cube textured. Full width at half maximum values of the omega and phi scans of the electrodeposited layers were better than those of the Ni-W base substrates, indicating improved biaxial texturing of the electrodeposited layers. AES analysis of the YBCO/CeO2/yttria-stabilized zirconia/electrodeposited CeO2/Ni-W revealed that Ni interdiffusion was completely stopped at the first electrodeposited CeO2 layer. (c) 2006 The Electrochemical Society.