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Surface morphologies of homoepitaxial ZnO thin films on non-miscut ZnO substrates
被引:1
作者:
Wei, M.
[1
]
Boutwell, R. C.
[1
]
Schoenfeld, W. V.
[1
]
机构:
[1] Univ Cent Florida, CREOL, Coll Opt & Photon, Orlando, FL 32816 USA
关键词:
Non-miscut ZnO substrates;
Molecular beam epitaxy;
Homoepitaxy;
Atomic force microscopy;
Surface morphology;
TEMPERATURE;
PLASMA;
POLAR;
D O I:
10.1016/j.apsusc.2013.04.037
中图分类号:
O64 [物理化学(理论化学)、化学物理学];
学科分类号:
070304 ;
081704 ;
摘要:
ZnO thin films were grown on Zn-polar non-miscut ZnO substrates by plasma-assisted molecular beam epitaxy (PAMBE). With an electrostatic ion trap applied to the oxygen plasma source, the etching effect by plasma was significantly reduced. Atomically flat surfaces with one monolayer step height along the [0001] direction were achieved at a low growth temperature of 610 degrees C. Good surface morphology with root mean square (RMS) roughness as small as 0.16 nm was achieved. High oxygen plasma power and low Zn flux were necessary to achieve a step-flow growth mode with a homogeneous surface morphology. It was found that the growth rate and surface RMS roughness decreased with increased growth temperature. (C) 2013 Elsevier B.V. All rights reserved.
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页码:263 / 267
页数:5
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