Internal stresses in polycrystalline zirconia: Microstructure effects

被引：6

作者：

Berdin, Clotilde ^{[1
]}

Yao, Zhao Yue ^{[1
,2
]}

Pascal, Serge ^{[2
]}

机构：

[1] Univ Paris 11, LEMHE ICMMO, CNRS UMR 8182, F-91405 Orsay, France

[2] CEA Saclay, CEA, DEN, DM2S,SEMT, F-91191 Gif Sur Yvette, France

来源：

COMPUTATIONAL MATERIALS SCIENCE | 2013年 / 70卷

关键词：

Internal stress; Polycrystalline aggregate; Monoclinic; Tetragonal zirconia; Textures; Finite element analysis; Voronoi polyhedra; THIN-FILMS; ZRO2;

D O I：

10.1016/j.commatsci.2012.12.019

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Zirconium oxide layers are submitted to internal stresses that play a role in damage of the layer. If the first order stresses are usually measured or computed, the second order stresses are also important for damage prediction, but they are difficult to measure. Microstructure simulations are performed with the finite element method to obtain internal stresses at grain scale of zirconia. The influences of the crystallographic and morphological textures are studied for monoclinic and tetragonal zirconia. The results show that crystallographic texture has a strong influence on the second order stresses, but not the morphological texture. (C) 2012 Elsevier B. V. All rights reserved.

引用

页码：140 / 144

页数：5

共 17 条

[1] Determination of residual stresses in zirconia layer using X-ray diffraction and by a micromechanical approach:: thermoelastic anisotropy effect [J].

Béchade, J ;

Brenner, R ;

Goudeau, R ;

Gailhanou, M .

REVUE DE METALLURGIE-CAHIERS D INFORMATIONS TECHNIQUES, 2003, 100 (12) :1151-+

[2] Stress driven phase transformation in ZrO2 film [J].

Benali, B. ;

Ghysel, M. Herbst ;

Gallet, I. ;

Huntz, A. M. ;

Andrieux, M. .

APPLIED SURFACE SCIENCE, 2006, 253 (03) :1222-1226

[3] Synthesis, structure, microstructure and mechanical characteristics of MO CVD deposited zirconia films [J].

Bernard, O. ;

Huntz, A. M. ;

Andrieux, M. ;

Seiler, W. ;

Ji, V. ;

Poissonnet, S. .

APPLIED SURFACE SCIENCE, 2007, 253 (10) :4626-4640

[4] Mechanical and microstructural characterisation of oxide films damage [J].

Bernard, O ;

Amiri, G ;

Haut, C ;

Feltz, B ;

Huntz, AM ;

Andrieux, M .

MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2002, 335 (1-2) :32-42

[5] Some elements of microstructural mechanics [J].

Cailletaud, G ;

Forest, S ;

Jeulin, D ;

Feyel, F ;

Galliet, I ;

Mounoury, V ;

Quilici, S .

COMPUTATIONAL MATERIALS SCIENCE, 2003, 27 (03) :351-374

[6] Residual stress gradient analysis with GIXRD on ZrO2 thin films deposited by MOCVD [J].

Chen, Zhe ;

Prud'homme, Nathalie ;

Wang, Bin ;

Ji, Vincent .

SURFACE & COATINGS TECHNOLOGY, 2011, 206 (2-3) :405-410

[7]

Engleret O., 2011, INTRO TEXTURE ANAL

[8] A framework for automated analysis and simulation of 3D polycrystalline micro structures. Part 2: Synthetic structure generation [J].

Groeber, Michael ;

Ghosh, Somnath ;

Uchic, Michael D. ;

Dimiduk, Dennis M. .

ACTA MATERIALIA, 2008, 56 (06) :1274-1287

[9] THE CRACKING AND DECOHESION OF THIN-FILMS ON DUCTILE SUBSTRATES [J].

HU, MS ;

EVANS, AG .

ACTA METALLURGICA, 1989, 37 (03) :917-925

[10] Thermal expansion coefficient of alumina films developed by oxidation of a FeCrAl alloy determined by a deflection technique [J].

Huntz, A. M. ;

Marechal, L. ;

Lesage, B. ;

Molins, R. .

APPLIED SURFACE SCIENCE, 2006, 252 (22) :7781-7787

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