X-ray photoelectron spectroscopy analysis for undegraded and degraded Gd2O2S:Tb3+ phosphor thin films

被引：10

作者：

Dolo, J. J. ^{[1
]}

Swart, H. C. ^{[1
]}

Terblans, J. J. ^{[1
]}

Coetsee, E. ^{[1
]}

Ntwaeaborwa, O. M. ^{[1
]}

Dejene, B. F. ^{[1
]}

机构：

[1] Univ Orange Free State, Dept Phys, ZA-9300 Bloemfontein, South Africa

来源：

PHYSICA B-CONDENSED MATTER | 2012年 / 407卷 / 10期

基金：

新加坡国家研究基金会;

关键词：

Gd2O2S:Tb3+; PLD; Thin films; CL; PL; XPS; Electron degradation; PHOTOLUMINESCENCE; XPS;

D O I：

10.1016/j.physb.2011.09.092

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

This paper presents the X-ray Photoelectron Spectroscopy (XPS) analysis for the undegraded and degraded Gd2O2S:Tb3+ thin film phosphor. The thin films were grown with the pulsed laser deposition (PLD) technique. XPS measurements were done on Gd2O2S:Tb3+ phosphor thin films before and after electron degradation. The XPS technique has proven the presence of Gd2O3 on the degraded and undegraded thin film spots. The presence of the SO2 bonding was also detected after degradation. This clearly indicates that surface reactions did occur during prolonged electron bombardment in an oxygen atmosphere. (C) 2011 Elsevier B.V. All rights reserved.

引用

页码：1586 / 1590

页数：5

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