Statistical Process Monitoring in the Era of Smart Manufacturing

被引:0
作者
He, Q. Peter [1 ]
Wang, Jin [1 ]
机构
[1] Auburn Univ, Dept Chem Engn, Auburn, AL 36849 USA
来源
2017 AMERICAN CONTROL CONFERENCE (ACC) | 2017年
基金
美国国家科学基金会;
关键词
INDEPENDENT COMPONENT ANALYSIS; FAULT-DETECTION; PATTERN-ANALYSIS; DIAGNOSIS;
D O I
暂无
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
One of the focuses of smart manufacturing is to create manufacturing intelligence from real-time data to support accurate and timely decision-making. Therefore, data-driven statistical process monitoring is expected to contribute significantly to the advancement of smart manufacturing. In this work, a roadmap of statistical process monitoring (SPM) is presented and we propose statistics pattern analysis (SPA) as a promising SPM tool for smart manufacturing. The rationale behind SPA is discussed and compared with other SPM methods. Simulated and industrial case studies are presented to demonstrate the superior performance of SPA in fault detection and diagnosis. The potential capabilities of SPA to address the characteristics of the big data from smart manufacturing are discussed.
引用
收藏
页码:4797 / 4802
页数:6
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