Electron impact ionization in a microion trap mass spectrometer

被引：25

作者：

Kornienko, O ^{[1
]}

Reilly, PTA ^{[1
]}

Whitten, WB ^{[1
]}

Ramsey, JM ^{[1
]}

机构：

[1] Oak Ridge Natl Lab, Oak Ridge, TN 37831 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1999年 / 70卷 / 10期

关键词：

D O I：

10.1063/1.1150010

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A microscale ion trap mass spectrometer (r(0)=0.50 mm, z(0)=0.55 mm) with an electron gun for electron impact ionization of gaseous samples is described. Operated in the mass-instability mode, the trap had a m/z range from 40 to 400 Da. For single scans, peak widths of less than 0.2 Da were obtained. (C) 1999 American Institute of Physics. [S0034-6748(99)02110-3].

引用

页码：3907 / 3909

页数：3

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